Science and Technology Production
Article
Authorship
GARCIA, EVELINA ANDREA
;
C. González Pascual
;
E. C. Goldberg
;
J. E. Gayone
;
E. A. Sánchez
;
O. Grizzi
Date
2003
Publishing House and Editing Place
ELSEVIER SCIENCE BV
Magazine
SURFACE SCIENCE,
vol. 541
(pp. 160-170)
ELSEVIER SCIENCE BV
Summary
Information provided by the agent in
SIGEVA
Ion scattering spectrometry with time-of-flight analysis is used to measure the ion fractions in 6 keV Neþ projectilesscattered from a GaAs(1 1 0) surface for a broad incidence and observation angular range. The neutralization of theNeþ ions is studied by using a Greens function formalism to solve the time-dependent collisional process. The interactingsystem is described by a spin-less Anderson-like Hamiltonian where the valence and localized states of the surfaceare taken into acco...
Ion scattering spectrometry with time-of-flight analysis is used to measure the ion fractions in 6 keV Neþ projectilesscattered from a GaAs(1 1 0) surface for a broad incidence and observation angular range. The neutralization of theNeþ ions is studied by using a Greens function formalism to solve the time-dependent collisional process. The interactingsystem is described by a spin-less Anderson-like Hamiltonian where the valence and localized states of the surfaceare taken into account. Two important ingredients are incorporated in the theoretical model: the description of thereconstructed surface by using a molecular dynamics density functional theory in the local density approximation tocalculate the local an partial density of states; and the calculation of the Hamiltonian interaction terms by consideringthe orientations of the projectile orbitals with respect to the reference frame provided by the surface. The results allowto infer that the different behaviour observed in the ion fractions of the projectiles scattered from As and Ga atoms canbe mainly related to resonant neutralization processes that are strongly determined by the local electronic structure ofthe surface. The angular dependence of the ion fraction for two different scattering angles is analyzed.
Show more
Show less
Key Words
SCATTERINGLEISION-SURFACE INTEARACTIONMOLECULAR DYNAMICS